XYC 306 Rapid Drying Film Lubricant for ICT Testing High-Performance Solution 1KG

    XYC 306 1KG
    Xiaoyichong 306 ICT probe fast-drying film lubricant is a high-performance lubricant designed for test probes, featuring ultra-low resistance, rapid drying, and anti-wear properties to extend probe life and prevent oxidation. Its technical parameters include a composition of fluorinated synthetic oil and nano-graphite, a volatilization time of 15±5 seconds, and a working temperature range of -40℃ to +180℃, making it suitable for various applications in ICT testing, semiconductor testing, and precision connectors.
    minimum order: 
    1 piece
    Supply Ability: 
    10000piece / Month
    Country of Origin: 
    China
    Stock Time: 
    3Day
    Quantity:
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    XYC 306 Rapid Drying Film Lubricant for ICT Testing High-Performance Solution 1KG

    Product Overview

    - Name: XYC 306 ICT Rapid-Drying Film Lubricant
    - Type: rapid drying film lubricant, high performance lubricant, ICT testing lubricant; high-performance lubricant specially designed for testing probes (e.g., PCB test pins, spring-loaded test probes)

    Key Characteristics

    - Ultra-Low Resistance: Ensures no interference with signal transmission during testing; contact resistance variation ≤0.5mΩ.
    - Rapid Drying: Fully evaporates within 10–20 seconds, ideal for high-speed testing equipment.
    - Wear Resistance: Contains nano-level lubricating particles, extending probe lifespan by 3–5 times.
    - Anti-Oxidation: Forms a protective film to prevent contact failures due to sulfurization and oxidation.

    Technical Specifications

    Item

    Parameters/Testing Standards

    Base Composition

    Fluorinated Synthetic Oil + Nano Graphite

    Evaporation Time

    15±5 seconds (25°C, 50% RH)

    Operating Temperature

    -40°C ~ +180°C

    Contact Resistance

    ≤0.5mΩ (MIL-STD-202)

    Insulation Resistance

    ≥10^12Ω (IEC 60167)

    Scope of Application

    - ICT Testing Equipment: PCB test beds, spring-loaded test probes.
    - Semiconductor Testing: Wafer probe cards, test sockets.
    - Precision Connectors: BGA test sockets, high-frequency connectors.
    - Industrial Inspection: Sliding contacts in automated testing devices.

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